AFM‐Based Spin‐Exchange Microscopy Using Chiral Molecules
Autorzy: Amir Ziv, Abhijit Saha, Hen Alpern, Nir Sukenik, Lech Tomasz Baczewski, Shira Yochelis, Meital Reches, Yossi Paltiel
Jednostki: The Hebrew University of Jerusalem, Applied Physics Department, Center for Nanoscience and Nanotechnology, Institute of Chemistry | Polish Academy of Sciences, Institute of Physics
Źródło: Advanced Materials, Volume 3, Issue 40